| |
| 2001 | ||
|---|---|---|
| 1 | EE | Leo G. Henry, Mark A. Kelly, Tom Diep, Jon Barth: The importance of standardizing CDM ESD test head parameters to obtain data correlation. Microelectronics Reliability 41(11): 1789-1800 (2001) |
| 1 | Jon Barth | [1] |
| 2 | Tom Diep | [1] |
| 3 | Leo G. Henry | [1] |