John Richner
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2002
1
EE
Jon Barth
, John Richner: Correlation considerations: Real HBM to TLP and HBM testers.
Microelectronics Reliability 42
(6): 909-917 (2002)
Coauthor
Index
1
Jon Barth
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
