| |
| 2006 | ||
|---|---|---|
| 2 | EE | D. Barlini, Mauro Ciappa, Alberto Castellazzi, Michel Mermet-Guyennet, Wolfgang Fichtner: New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions. Microelectronics Reliability 46(9-11): 1772-1777 (2006) |
| 1 | EE | X. Perpiñà, J. F. Serviere, J. Saiz, D. Barlini, Michel Mermet-Guyennet, J. Millán: Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current. Microelectronics Reliability 46(9-11): 1834-1839 (2006) |
| 1 | Alberto Castellazzi | [2] |
| 2 | Mauro Ciappa | [2] |
| 3 | Wolfgang Fichtner | [2] |
| 4 | Michel Mermet-Guyennet | [1] [2] |
| 5 | J. Millán | [1] |
| 6 | X. Perpiñà | [1] |
| 7 | J. Saiz | [1] |
| 8 | J. F. Serviere | [1] |