| |
| 2003 | ||
|---|---|---|
| 3 | EE | Jan Ackaert, Klara Bessemans, Eddy De Backer: Charging induced damage by photoconduction through thick inter metal dielectrics. Microelectronics Reliability 43(9-11): 1525-1529 (2003) |
| 2001 | ||
| 2 | EE | Peter Coppens, Guido Vanhorebeek, Eddy De Backer: Correlation between predicted cause of SRAM failures and in-line defect data. Microelectronics Reliability 41(1): 53-57 (2001) |
| 1 | Jan Ackaert, Z. Wang, Eddy De Backer, P. Colson, Peter Coppens: Non Contact Surface Potential Measurements for Charging Reduction During Manufacturing of Metal-Insulator-Metal Capacitors. Microelectronics Reliability 41(9-10): 1403-1407 (2001) | |
| 1 | Jan Ackaert | [1] [3] |
| 2 | Klara Bessemans | [3] |
| 3 | P. Colson | [1] |
| 4 | Peter Coppens | [1] [2] |
| 5 | Guido Vanhorebeek | [2] |
| 6 | Z. Wang | [1] |