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Guido Vanhorebeek

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2001
1EEPeter Coppens, Guido Vanhorebeek, Eddy De Backer: Correlation between predicted cause of SRAM failures and in-line defect data. Microelectronics Reliability 41(1): 53-57 (2001)

Coauthor Index

1Eddy De Backer [1]
2Peter Coppens [1]

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