Klara Bessemans
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2003
1
EE
Jan Ackaert
, Klara Bessemans,
Eddy De Backer
: Charging induced damage by photoconduction through thick inter metal dielectrics.
Microelectronics Reliability 43
(9-11): 1525-1529 (2003)
Coauthor
Index
1
Jan Ackaert
[
1
]
2
Eddy De Backer
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
