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| 2006 | ||
|---|---|---|
| 8 | EE | S. Raghunath, S. M. Aziz: Design of an Area Efficient High-Speed Color FDWT Processor. APCCAS 2006: 474-477 | 
| 2002 | ||
| 7 | EE | S. M. Aziz, S. J. Carr: On C-Testability of Carry Free Dividers. DELTA 2002: 417-424 | 
| 6 | EE | S. M. Aziz, C. N. Basheer, Joarder Kamruzzaman: A Synthesisable VHDL Model for an Easily Testable Generalised Multiplier. DELTA 2002: 504-506 | 
| 2001 | ||
| 5 | EE | A. B. M. Harun-ur Rashid, M. Karim, S. M. Aziz: Testing complementary pass-transistor logic circuits. ISCAS (4) 2001: 5-8 | 
| 1998 | ||
| 4 | EE | S. M. Aziz, Joarder Kamruzzaman: Fault Characterization of Low Capacitance Full-Swing BiCMOS Logic Circuits. Asian Test Symposium 1998: 119- | 
| 1995 | ||
| 3 | EE | S. M. Aziz: A C-testable modified Booth's array multiplier. VLSI Design 1995: 278-282 | 
| 1994 | ||
| 2 | S. M. Aziz, W. A. J. Waller: On Testability of Differential Split-Level CMOS Circuits. VLSI Design 1994: 191-196 | |
| 1993 | ||
| 1 | W. A. J. Waller, S. M. Aziz: A C-testable parallel multiplier using differential cascode voltage switch (DDVS) logic. VLSI 1993: 133-142 | |
| 1 | C. N. Basheer | [6] | 
| 2 | S. J. Carr | [7] | 
| 3 | Joarder Kamruzzaman | [4] [6] | 
| 4 | M. Karim | [5] | 
| 5 | S. Raghunath | [8] | 
| 6 | A. B. M. Harun-ur Rashid | [5] | 
| 7 | W. A. J. Waller | [1] [2] |