2006 | ||
---|---|---|
8 | EE | S. Raghunath, S. M. Aziz: Design of an Area Efficient High-Speed Color FDWT Processor. APCCAS 2006: 474-477 |
2002 | ||
7 | EE | S. M. Aziz, S. J. Carr: On C-Testability of Carry Free Dividers. DELTA 2002: 417-424 |
6 | EE | S. M. Aziz, C. N. Basheer, Joarder Kamruzzaman: A Synthesisable VHDL Model for an Easily Testable Generalised Multiplier. DELTA 2002: 504-506 |
2001 | ||
5 | EE | A. B. M. Harun-ur Rashid, M. Karim, S. M. Aziz: Testing complementary pass-transistor logic circuits. ISCAS (4) 2001: 5-8 |
1998 | ||
4 | EE | S. M. Aziz, Joarder Kamruzzaman: Fault Characterization of Low Capacitance Full-Swing BiCMOS Logic Circuits. Asian Test Symposium 1998: 119- |
1995 | ||
3 | EE | S. M. Aziz: A C-testable modified Booth's array multiplier. VLSI Design 1995: 278-282 |
1994 | ||
2 | S. M. Aziz, W. A. J. Waller: On Testability of Differential Split-Level CMOS Circuits. VLSI Design 1994: 191-196 | |
1993 | ||
1 | W. A. J. Waller, S. M. Aziz: A C-testable parallel multiplier using differential cascode voltage switch (DDVS) logic. VLSI 1993: 133-142 |
1 | C. N. Basheer | [6] |
2 | S. J. Carr | [7] |
3 | Joarder Kamruzzaman | [4] [6] |
4 | M. Karim | [5] |
5 | S. Raghunath | [8] |
6 | A. B. M. Harun-ur Rashid | [5] |
7 | W. A. J. Waller | [1] [2] |