Pattern Recognition, Volume 4

Volume 4, Number 1, January 1972

• Robert S. Ledley:
  Editorial comment. 1
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• K. S. Fu:
  Introduction to special issue on syntactic pattern recognition--part two. 3
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• Theodosios Pavlidis:
  Representation of figures by labeled graphs. 5-17
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• Kenneth J. Breeding, John O. Amoss:
  A pattern description language - PADEL. 19-36
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• John Mylopoulos:
  On the application of formal language and automata theory to pattern recognition. 37-51
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• Luigia Carlucci:
  A formal system for texture languages. 53-72
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• J. C. Simon, A. Checroun, C. Roche:
  A method of comparing two patterns independent of possible transformations and small distortions. 73-81
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• Philip H. Swain, K. S. Fu:
  Stochastic programmed grammars for syntactic pattern recognition. 83-100
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• I. B. Muchnik:
  Simulation of process of forming the language for description and analysis of the forms of images. 101-140
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Volume 4, Number 2, May 1972

• Robert S. Ledley:
  Introduction to the special issue on fine particle science. 145
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• Brian H. Kaye:
  Efficient pattern recognition in fine particle science. 147-150
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• A. I. Medalia, G. J. Hornik:
  Pattern recognition problems in the study of carbon black. 155-158
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• E. W. White, Kathy Mayberry, G. G. Johnson Jr.:
  Computer analysis of multi-channel SEM and X-ray images from fine particles. 173-192
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• Brian H. Kaye, A. G. Naylor:
  An optical information procedure for characterizing the shape of fine particle images. 195-196
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• C. B. Shelman:
  The application of list processing techniques to picture processing. 201-210
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• Edward A. Patrick, Joseph Altman, Richard Wild:
  Computer output display of cells and cell features. 211-226
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Volume 4, Number 3, October 1972

• Robert S. Ledley: About this issue. 233 BibTeX
• John F. Betak:
  Measuring two-dimensional complexity: A conceptual structure. 235-242
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• Yoshiaki Shirai:
  Recognition of polyhedrons with a range finder. 243-244
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• Kokichi Tanaka, Kazumasa Ozawa:
  A new type of feature extraction of patterns using coherent optical system. 251-262
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• David M. Jackson, Lee J. White:
  Effect of random errors on generalized distance computations. 263-273
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• R. M. Bowman, Eugene S. McVey:
  Calculation of multi-category minimum distance classifier recognition error for binomial measurement distributions. 275-288
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• Tsuguchika Kaminuma, Satosi Watanabe:
  Fast-converging adaptive algorithms for well-balanced separating linear classifier. 289-305
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• Israel Gitman:
  A parameter-free clustering model. 307-315
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• Ronald L. Citrenbaum:
  Strategic pattern generation: A solution technique for a class of games. 317-329
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• William J. Sacco, Wayne S. Copes:
  Reduction of the class of feature evaluation techniques in pattern analysis. 331-332
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Volume 4, Number 4, December 1972

• Robert S. Ledley:
  About this issue. 341
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• Yoshiaki Shirai, Saburo Tsuji:
  Extraction of the line drawing of 3-dimensional objects by sequential illumination from several directions. 343-344
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• Sheldon S. Sandler:
  Direct three-dimensional analysis of electron micrograph pictures. 353-359
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• Oscar Firschein, Martin A. Fischler:
  A study in descriptive representation of pictorial data. 361-366
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• D. W. Thomas, B. R. Wilkins:
  The analysis of vehicle sounds for recognition. 379-389
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• Lucio Pietrantonio, Peter C. Jurs:
  Iterative least squares development of discriminant functions for spectroscopic data analysis by pattern recognition. 391-400
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• Periagaram K. Rajasekaran, Mandyam D. Srinath:
  Unsupervised learning in nongaussian pattern recognition. 401-416
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