Pattern Recognition
, Volume 4
Volume 4, Number 1, January 1972
Robert S. Ledley
:
Editorial comment.
1
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K. S. Fu
:
Introduction to special issue on syntactic pattern recognition--part two.
3
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Theodosios Pavlidis
:
Representation of figures by labeled graphs.
5-17
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Kenneth J. Breeding
,
John O. Amoss
:
A pattern description language - PADEL.
19-36
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John Mylopoulos
:
On the application of formal language and automata theory to pattern recognition.
37-51
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Luigia Carlucci
:
A formal system for texture languages.
53-72
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J. C. Simon
,
A. Checroun
,
C. Roche
:
A method of comparing two patterns independent of possible transformations and small distortions.
73-81
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Philip H. Swain
,
K. S. Fu
:
Stochastic programmed grammars for syntactic pattern recognition.
83-100
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I. B. Muchnik
:
Simulation of process of forming the language for description and analysis of the forms of images.
101-140
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Volume 4, Number 2, May 1972
Robert S. Ledley
:
Introduction to the special issue on fine particle science.
145
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Brian H. Kaye
:
Efficient pattern recognition in fine particle science.
147-150
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A. I. Medalia
,
G. J. Hornik
:
Pattern recognition problems in the study of carbon black.
155-158
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E. W. White
,
Kathy Mayberry
,
G. G. Johnson Jr.
:
Computer analysis of multi-channel SEM and X-ray images from fine particles.
173-192
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Brian H. Kaye
,
A. G. Naylor
:
An optical information procedure for characterizing the shape of fine particle images.
195-196
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C. B. Shelman
:
The application of list processing techniques to picture processing.
201-210
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Edward A. Patrick
,
Joseph Altman
,
Richard Wild
:
Computer output display of cells and cell features.
211-226
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Volume 4, Number 3, October 1972
Robert S. Ledley
: About this issue. 233
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John F. Betak
:
Measuring two-dimensional complexity: A conceptual structure.
235-242
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Yoshiaki Shirai
:
Recognition of polyhedrons with a range finder.
243-244
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Kokichi Tanaka
,
Kazumasa Ozawa
:
A new type of feature extraction of patterns using coherent optical system.
251-262
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David M. Jackson
,
Lee J. White
:
Effect of random errors on generalized distance computations.
263-273
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R. M. Bowman
,
Eugene S. McVey
:
Calculation of multi-category minimum distance classifier recognition error for binomial measurement distributions.
275-288
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Tsuguchika Kaminuma
,
Satosi Watanabe
:
Fast-converging adaptive algorithms for well-balanced separating linear classifier.
289-305
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Israel Gitman
:
A parameter-free clustering model.
307-315
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Ronald L. Citrenbaum
:
Strategic pattern generation: A solution technique for a class of games.
317-329
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William J. Sacco
,
Wayne S. Copes
:
Reduction of the class of feature evaluation techniques in pattern analysis.
331-332
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Volume 4, Number 4, December 1972
Robert S. Ledley
:
About this issue.
341
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Yoshiaki Shirai
,
Saburo Tsuji
:
Extraction of the line drawing of 3-dimensional objects by sequential illumination from several directions.
343-344
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Sheldon S. Sandler
:
Direct three-dimensional analysis of electron micrograph pictures.
353-359
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Oscar Firschein
,
Martin A. Fischler
:
A study in descriptive representation of pictorial data.
361-366
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D. W. Thomas
,
B. R. Wilkins
:
The analysis of vehicle sounds for recognition.
379-389
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Lucio Pietrantonio
,
Peter C. Jurs
:
Iterative least squares development of discriminant functions for spectroscopic data analysis by pattern recognition.
391-400
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Periagaram K. Rajasekaran
,
Mandyam D. Srinath
:
Unsupervised learning in nongaussian pattern recognition.
401-416
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Copyright ©
Sun May 17 00:17:10 2009 by
Michael Ley
(
ley@uni-trier.de
)