| |
| 1972 | ||
|---|---|---|
| 2 | EE | R. M. Bowman, Eugene S. McVey: Calculation of multi-category minimum distance classifier recognition error for binomial measurement distributions. Pattern Recognition 4(3): 275-288 (1972) |
| 1970 | ||
| 1 | EE | R. M. Bowman, Eugene S. McVey: A method for the optimal design of a class of pattern recognition systems. Pattern Recognition 2(3): 187-197 (1970) |
| 1 | Eugene S. McVey | [1] [2] |