2008 |
46 | EE | Brian Robinson,
Lee J. White:
Testing of User-Configurable Software Systems Using Firewalls.
ISSRE 2008: 177-186 |
45 | EE | Lee J. White,
Khaled Jaber,
Brian Robinson,
Václav Rajlich:
Extended firewall for regression testing: an experience report.
Journal of Software Maintenance 20(6): 419-433 (2008) |
2006 |
44 | EE | Lee J. White:
Editorial: STVR Editor changes.
Softw. Test., Verif. Reliab. 16(4): 213-214 (2006) |
2005 |
43 | EE | Lee J. White,
Khaled Jaber,
Brian Robinson:
Utilization of Extended Firewall for Object-Oriented Regression Testing.
ICSM 2005: 695-698 |
42 | EE | Lee J. White:
Editorial: Looking for surprises in testing?
Softw. Test., Verif. Reliab. 15(1): 1-2 (2005) |
2004 |
41 | EE | Lee J. White,
Brian Robinson:
Industrial Real-Time Regression Testing and Analysis Using Firewalls.
ICSM 2004: 18-27 |
40 | EE | Lee J. White:
Editorial: Software testing as related to project risk.
Softw. Test., Verif. Reliab. 14(1): 1-2 (2004) |
2003 |
39 | EE | Lee J. White,
Husain Almezen,
Shivakumar Sastry:
Firewall Regression Testing of GUI Sequences and their Interactions.
ICSM 2003: 398-409 |
2002 |
38 | EE | Ponrudee Netisopakul,
Lee J. White,
John Morris:
Data Coverage Testing.
APSEC 2002: 465- |
37 | EE | Ponrudee Netisopakul,
Lee J. White,
John Morris,
Daniel Hoffman:
Data Coverage Testing of Programs for Container Classes.
ISSRE 2002: 183-194 |
36 | | Lee J. White,
Martin R. Woodward:
List of Referees.
Softw. Test., Verif. Reliab. 12(1): 63-64 (2002) |
35 | EE | Lee J. White:
Editorial: The importance of empirical work for software engineering papers.
Softw. Test., Verif. Reliab. 12(4): 195-196 (2002) |
2001 |
34 | EE | Lee J. White,
Husain Almezen,
Nasser Alzeidi:
User-Based Testing of GUI Sequences and Their Interactions.
ISSRE 2001: 54-65 |
33 | | Lee J. White:
Editorial: Specification-based testing revisited?
Softw. Test., Verif. Reliab. 11(1): 1-2 (2001) |
2000 |
32 | EE | David Leon,
Andy Podgurski,
Lee J. White:
Multivariate visualization in observation-based testing.
ICSE 2000: 116-125 |
31 | EE | James E. Kimble Jr.,
Lee J. White:
An Alternative Source Code Analysis.
ICSM 2000: 64-75 |
30 | EE | Lee J. White,
Husain Almezen:
Generating Test Cases for GUI Responsibilities Using Complete Interaction Sequences.
ISSRE 2000: 110-123 |
29 | | Thomas Ball,
Daniel Hoffman,
Frank Ruskey,
Richard Webber,
Lee J. White:
State Generation and Automated Class Testing.
Softw. Test., Verif. Reliab. 10(3): 149-170 (2000) |
1999 |
28 | | Daniel Hoffman,
Paul A. Strooper,
Lee J. White:
Boundary Values and Automated Component Testing.
Softw. Test., Verif. Reliab. 9(1): 3-26 (1999) |
27 | | Lee J. White:
Editorial: Submission of Position Papers and Letters to the Editor.
Softw. Test., Verif. Reliab. 9(4): 199-200 (1999) |
1998 |
26 | | Lee J. White:
Editorial: What is the Developer-to-Tester Ratio?
Softw. Test., Verif. Reliab. 8(3): 111-112 (1998) |
1997 |
25 | | Lee J. White:
Editorial: A six-year perspective - the readership and content of STVR.
Softw. Test., Verif. Reliab. 7(4): 199-200 (1997) |
1996 |
24 | EE | Lee J. White:
Regression Testing of GUI Event Interactions.
ICSM 1996: 350-358 |
23 | | Lee J. White:
Editorial: About the contents of this double issue - `Testing Object-Oriented Software: A Survey' by Robert V. Binder.
Softw. Test., Verif. Reliab. 6(3/4): 123-124 (1996) |
1995 |
22 | EE | Khalil Abdullah,
James E. Kimble Jr.,
Lee J. White:
Correcting for unreliable regression integration testing.
ICSM 1995: 232-241 |
21 | | Lee J. White:
Editorial.
Softw. Test., Verif. Reliab. 5(4): 211-212 (1995) |
1994 |
20 | | Lee J. White:
Editorial: Too Many Conference Choices?
Softw. Test., Verif. Reliab. 4(4): 199-201 (1994) |
1993 |
19 | | Lee J. White,
Venkatasubramaniam Narayanswamy,
Ted Friedman,
Marc Kirschenbaum,
Paul Piwowarski,
Mitsuru Oha:
Test Manager: A Regression Testing Tool.
ICSM 1993: 338-347 |
18 | | Lee J. White:
Editorial: Need for a Testing Metric - Error Detection Rate.
Softw. Test., Verif. Reliab. 3(2): 61-62 (1993) |
1992 |
17 | EE | Faten H. Afifi,
Lee J. White,
Steven J. Zeil:
Testing for Linear Errors in Nonlinear Computer Programs.
ICSE 1992: 81-91 |
16 | EE | Steven J. Zeil,
Faten H. Afifi,
Lee J. White:
Detection of Linear Errors via Domain Testing.
ACM Trans. Softw. Eng. Methodol. 1(4): 422-451 (1992) |
15 | | Lee J. White:
Editorial.
Softw. Test., Verif. Reliab. 2(2): 51-52 (1992) |
1991 |
14 | | Lee J. White:
Editorial.
Softw. Test., Verif. Reliab. 1(2): 3-4 (1991) |
13 | | Lee J. White,
Bogdan Wiszniewski:
Path Testing of Computer Programs with Loops Using a Tool for Simple Loop Patterns.
Softw., Pract. Exper. 21(10): 1075-1102 (1991) |
1987 |
12 | | Lee J. White:
Software Testing and Verification.
Advances in Computers 26: 335-391 (1987) |
1985 |
11 | | Lee J. White,
P. N. Sahay:
Experiments Determining Best Paths for Testing Computer Program Predicates.
ICSE 1985: 238-243 |
1984 |
10 | EE | Lee J. White:
The evolution of an integrated testing environment by the Domain Testing Strategy.
ACM Conference on Computer Science 1984: 69-74 |
1981 |
9 | | Steven J. Zeil,
Lee J. White:
Sufficient Tset Sets for Path Analysis Testing Strategies.
ICSE 1981: 184-194 |
1980 |
8 | | Lee J. White,
Edward I. Cohen:
A Domain Strategy for Computer Program Testing.
IEEE Trans. Software Eng. 6(3): 247-257 (1980) |
7 | EE | Sargur N. Srihari,
Thomas Snabb,
Lee J. White:
An algorithm for determining identity of nearest-neighbor and potential function decision rules.
Pattern Recognition 12(5): 293-299 (1980) |
1979 |
6 | EE | Sargur N. Srihari,
Lee J. White,
Thomas Snabb:
Identity conditions for nearest-neighbor and potential-function classifiers.
Inf. Sci. 19(1): 21-31 (1979) |
1978 |
5 | | K. S. Natarajan,
Lee J. White:
Optimum Domination in Weighted Trees.
Inf. Process. Lett. 7(6): 261-265 (1978) |
4 | EE | Gautam Kar,
Lee J. White:
A distance measure for automatic document classification by sequential analysis.
Inf. Process. Manage. 14(2): 57-69 (1978) |
3 | EE | B. Dasarathy,
Lee J. White:
A characterization of nearest-neighbor rule decision surfaces and a new approach to generate them.
Pattern Recognition 10(1): 41-46 (1978) |
1974 |
2 | EE | Lee J. White,
A. Art Ksienski:
Aircraft identification using a bilinear surface representation of radar data.
Pattern Recognition 6(1): 35-45 (1974) |
1972 |
1 | EE | David M. Jackson,
Lee J. White:
Effect of random errors on generalized distance computations.
Pattern Recognition 4(3): 263-273 (1972) |