| |
| 2005 | ||
|---|---|---|
| 2 | EE | Yvan Maidon, Thomas Zimmer, André Ivanov: An Analog Circuit Fault Characterization Methodology. J. Electronic Testing 21(2): 127-134 (2005) |
| 2004 | ||
| 1 | EE | Hassène Mnif, Thomas Zimmer, Jean Luc Battaglia, Sébastien Fregonese: Representation of the SiGe HBT's thermal impedance by linear and recursive networks. Microelectronics Reliability 44(6): 945-950 (2004) |
| 1 | Jean Luc Battaglia | [1] |
| 2 | Sébastien Fregonese | [1] |
| 3 | André Ivanov | [2] |
| 4 | Yvan Maidon | [2] |
| 5 | Hassène Mnif | [1] |