Yvan Maidon
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2005
1
EE
Yvan Maidon,
Thomas Zimmer
,
André Ivanov
: An Analog Circuit Fault Characterization Methodology.
J. Electronic Testing 21
(2): 127-134 (2005)
Coauthor
Index
1
André Ivanov
[
1
]
2
Thomas Zimmer
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
