| |
| 2004 | ||
|---|---|---|
| 1 | EE | Hassène Mnif, Thomas Zimmer, Jean Luc Battaglia, Sébastien Fregonese: Representation of the SiGe HBT's thermal impedance by linear and recursive networks. Microelectronics Reliability 44(6): 945-950 (2004) |
| 1 | Sébastien Fregonese | [1] |
| 2 | Hassène Mnif | [1] |
| 3 | Thomas Zimmer | [1] |