| |
| 2006 | ||
|---|---|---|
| 2 | EE | In Kyung Lee, Se Re Na Yun, Kyosun Kim, Chong-Gun Yu, Jong-Tae Park: New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors. Microelectronics Reliability 46(9-11): 1864-1867 (2006) |
| 2003 | ||
| 1 | EE | Se Re Na Yun, Won Sub Park, Byung Ha Lee, Jong-Tae Park: Hot electron induced punchthrough voltage of p-channel SOI MOSFET's at room and elevated temperatures. Microelectronics Reliability 43(9-11): 1477-1482 (2003) |
| 1 | Kyosun Kim | [2] |
| 2 | Byung Ha Lee | [1] |
| 3 | In Kyung Lee | [2] |
| 4 | Jong-Tae Park | [1] [2] |
| 5 | Won Sub Park | [1] |
| 6 | Chong-Gun Yu | [2] |