| |
| 2003 | ||
|---|---|---|
| 1 | EE | Se Re Na Yun, Won Sub Park, Byung Ha Lee, Jong-Tae Park: Hot electron induced punchthrough voltage of p-channel SOI MOSFET's at room and elevated temperatures. Microelectronics Reliability 43(9-11): 1477-1482 (2003) |
| 1 | Jong-Tae Park | [1] |
| 2 | Won Sub Park | [1] |
| 3 | Se Re Na Yun | [1] |