| |
| 2006 | ||
|---|---|---|
| 1 | EE | In Kyung Lee, Se Re Na Yun, Kyosun Kim, Chong-Gun Yu, Jong-Tae Park: New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors. Microelectronics Reliability 46(9-11): 1864-1867 (2006) |
| 1 | Kyosun Kim | [1] |
| 2 | Jong-Tae Park | [1] |
| 3 | Chong-Gun Yu | [1] |
| 4 | Se Re Na Yun | [1] |