| 2006 |
|---|
| 4 | EE | In Kyung Lee,
Se Re Na Yun,
Kyosun Kim,
Chong-Gun Yu,
Jong-Tae Park:
New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors.
Microelectronics Reliability 46(9-11): 1864-1867 (2006) |
| 2003 |
|---|
| 3 | EE | Jong-Tae Park,
Nag Jong Choi,
Chong-Gun Yu,
Seok Hee Jeon,
Jean-Pierre Colinge:
Increased hot carrier effects in Gate-All-Around SOI nMOSFET's.
Microelectronics Reliability 43(9-11): 1427-1432 (2003) |
| 1994 |
|---|
| 2 | | Chong-Gun Yu,
Randall L. Geiger:
An Accurate and Matching-Free Threshold Voltage Extraction Scheme for MOS Transistors.
ISCAS 1994: 115-118 |
| 1993 |
|---|
| 1 | | Chong-Gun Yu,
Randall L. Geiger:
Very Low Voltage Operational Amplifiers Using Floating Gate MOS Transistor.
ISCAS 1993: 1152-1155 |
