| |
| 2005 | ||
|---|---|---|
| 2 | EE | Jong Hun Kim, Kyosun Kim, Seok Hee Jeon, Jong-Tae Park: Reliability improvement by the suppression of keyhole generation in W-plug vias. Microelectronics Reliability 45(9-11): 1455-1458 (2005) |
| 2003 | ||
| 1 | EE | Jong-Tae Park, Nag Jong Choi, Chong-Gun Yu, Seok Hee Jeon, Jean-Pierre Colinge: Increased hot carrier effects in Gate-All-Around SOI nMOSFET's. Microelectronics Reliability 43(9-11): 1427-1432 (2003) |
| 1 | Nag Jong Choi | [1] |
| 2 | Jean-Pierre Colinge | [1] |
| 3 | Jong Hun Kim | [2] |
| 4 | Kyosun Kim | [2] |
| 5 | Jong-Tae Park | [1] [2] |
| 6 | Chong-Gun Yu | [1] |