C. Y. Yin

2003
1	EE	C. Y. Yin, M. O. Alam, Y. C. Chan, C. Bailey, Hua Lu: The effect of reflow process on the contact resistance and reliability of anisotropic conductive film interconnection for flip chip on flex applications. Microelectronics Reliability 43(4): 625-633 (2003)

Coauthor Index

1	M. O. Alam	[1]
2	C. Bailey	[1]
3	Y. C. Chan	[1]
4	Hua Lu	[1]