| 2004 |
|---|
| 6 | EE | Makoto Nakamura,
Hiroyuki Kamezawa,
Junji Tamatsukuri,
Mary Inaba,
Kei Hiraki,
K. Mizuguchi,
K. Torii,
S. Nakano,
Shizuo Yoshita,
Ryutaro Kurusu,
M. Sakamoto,
Y. Furukawa,
Takeshi Yanagisawa,
Yukichi Ikuta,
J. Shitami,
Akira Zinzaki:
Long Fat Pipe Congestion Control for Multi-Stream Data Transfer.
ISPAN 2004: 294-299 |
| 5 | EE | Takeshi Yanagisawa,
Takeshi Kojima,
Tadamasa Koyanagi:
Behavior of Cu(In, Ga)Se2 solar cells under light/damp heat over time.
Microelectronics Reliability 44(2): 229-235 (2004) |
| 2003 |
|---|
| 4 | EE | Takeshi Yanagisawa,
Takeshi Kojima:
The stability of the CuInSe2 solar mini-module I-V characteristics under continuous and light/dark irradiation cycle tests.
Microelectronics Reliability 43(3): 503-507 (2003) |
| 3 | EE | Takeshi Yanagisawa,
Takeshi Kojima:
Degradation of InGaN blue light-emitting diodes under continuous and low-speed pulse operations.
Microelectronics Reliability 43(6): 977-980 (2003) |
| 2002 |
|---|
| 2 | EE | Takeshi Yanagisawa,
Takeshi Kojima,
Tadamasa Koyanagi,
Kiyoshi Takahisa,
Kuniomi Nakamura:
Changes in the characteristics of CuInGaSe2 solar cells under light irradiation and during recovery: degradation analysis by the feeble light measuring method.
Microelectronics Reliability 42(2): 219-223 (2002) |
| 1994 |
|---|
| 1 | | Zdzislaw Czarnul,
Shigetaka Takagi,
Nobuo Fujii,
Tetsuya Iida,
Takeshi Yanagisawa:
Principles of nonlinearity Cancellation in Linear MOS Systems using MRC Circuits.
ISCAS 1994: 217-220 |
