| |
| 2004 | ||
|---|---|---|
| 2 | EE | Takeshi Yanagisawa, Takeshi Kojima, Tadamasa Koyanagi: Behavior of Cu(In, Ga)Se2 solar cells under light/damp heat over time. Microelectronics Reliability 44(2): 229-235 (2004) |
| 2002 | ||
| 1 | EE | Takeshi Yanagisawa, Takeshi Kojima, Tadamasa Koyanagi, Kiyoshi Takahisa, Kuniomi Nakamura: Changes in the characteristics of CuInGaSe2 solar cells under light irradiation and during recovery: degradation analysis by the feeble light measuring method. Microelectronics Reliability 42(2): 219-223 (2002) |
| 1 | Takeshi Kojima | [1] [2] |
| 2 | Kuniomi Nakamura | [1] |
| 3 | Kiyoshi Takahisa | [1] |
| 4 | Takeshi Yanagisawa | [1] [2] |