| |
| 2004 | ||
|---|---|---|
| 4 | EE | Takeshi Yanagisawa, Takeshi Kojima, Tadamasa Koyanagi: Behavior of Cu(In, Ga)Se2 solar cells under light/damp heat over time. Microelectronics Reliability 44(2): 229-235 (2004) |
| 2003 | ||
| 3 | EE | Takeshi Yanagisawa, Takeshi Kojima: The stability of the CuInSe2 solar mini-module I-V characteristics under continuous and light/dark irradiation cycle tests. Microelectronics Reliability 43(3): 503-507 (2003) |
| 2 | EE | Takeshi Yanagisawa, Takeshi Kojima: Degradation of InGaN blue light-emitting diodes under continuous and low-speed pulse operations. Microelectronics Reliability 43(6): 977-980 (2003) |
| 2002 | ||
| 1 | EE | Takeshi Yanagisawa, Takeshi Kojima, Tadamasa Koyanagi, Kiyoshi Takahisa, Kuniomi Nakamura: Changes in the characteristics of CuInGaSe2 solar cells under light irradiation and during recovery: degradation analysis by the feeble light measuring method. Microelectronics Reliability 42(2): 219-223 (2002) |
| 1 | Tadamasa Koyanagi | [1] [4] |
| 2 | Kuniomi Nakamura | [1] |
| 3 | Kiyoshi Takahisa | [1] |
| 4 | Takeshi Yanagisawa | [1] [2] [3] [4] |