| 2002 |
|---|
| 3 | EE | Yasuo Sato,
Iwao Yamazaki,
Hiroki Yamanaka,
Toshio Ikeda,
Masahiro Takakura:
A Persistent Diagnostic Technique for Unstable Defects.
ITC 2002: 242-249 |
| 2001 |
|---|
| 2 | EE | Iwao Yamazaki,
Hiroki Yamanaka,
Toshio Ikeda,
Masahiro Takakura,
Yasuo Sato:
An Approach to Improve the Resolution of Defect-Based Diagnosis.
Asian Test Symposium 2001: 123- |
| 1 | | Yasuo Sato,
Msaki Kohno,
Toshio Ikeda,
Iwao Yamazaki,
Masato Hamamoto:
An evaluation of defect-oriented test: WELL-controlled low voltage test.
ITC 2001: 1059-1067 |
