Masato Hamamoto

2001
1		Yasuo Sato, Msaki Kohno, Toshio Ikeda, Iwao Yamazaki, Masato Hamamoto: An evaluation of defect-oriented test: WELL-controlled low voltage test. ITC 2001: 1059-1067

Coauthor Index

1	Toshio Ikeda	[1]
2	Msaki Kohno	[1]
3	Yasuo Sato	[1]
4	Iwao Yamazaki	[1]