2005 | ||
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1 | EE | Atsushi Kurokawa, Masaharu Yamamoto, Nobuto Ono, Tetsuro Kage, Yasuaki Inoue, Hiroo Masuda: Capacitance and Yield Evaluations Using a 90-nm Process Technology Based on the Dense Power-Ground Interconnect Architecture. ISQED 2005: 153-158 |
1 | Yasuaki Inoue | [1] |
2 | Tetsuro Kage | [1] |
3 | Atsushi Kurokawa | [1] |
4 | Hiroo Masuda | [1] |
5 | Nobuto Ono | [1] |