Kenta Yamada

2008
3	EE	Kenta Yamada, Noriaki Oda: Statistical Corner Conditions of Interconnect Delay (Corner LPE Specifications). IEICE Transactions 91-C(4): 562-570 (2008)
2007
2	EE	Noriaki Oda, Hironori Imura, Naoyoshi Kawahara, Masayoshi Tagami, Hiroyuki Kunishima, Shuji Sone, Sadayuki Ohnishi, Kenta Yamada, Yumi Kakuhara, Makoto Sekine, Yoshihiro Hayashi, Kazuyoshi Ueno: Chip-Level Performance Maximization Using ASIS (Application-Specific Interconnect Structure) Wiring Design Concept for 45 nm CMOS Generation. IEICE Transactions 90-C(4): 848-855 (2007)
2006
1	EE	Kenta Yamada, Noriaki Oda: Statistical corner conditions of interconnect delay (corner LPE specifications). ASP-DAC 2006: 706-711

Coauthor Index

1	Yoshihiro Hayashi	[2]
2	Hironori Imura	[2]
3	Yumi Kakuhara	[2]
4	Naoyoshi Kawahara	[2]
5	Hiroyuki Kunishima	[2]
6	Noriaki Oda	[1] [2] [3]
7	Sadayuki Ohnishi	[2]
8	Makoto Sekine	[2]
9	Shuji Sone	[2]
10	Masayoshi Tagami	[2]
11	Kazuyoshi Ueno	[2]