Gilson I. Wirth

2008
13	EE	Christian Jesús B. Fayomi, Gilson I. Wirth, Jaime Ramírez-Angulo, Akira Matsuzawa: "The flipped voltage follower"-based low voltage fully differential CMOS sample-and-hold circuit. ISCAS 2008: 1716-1719
12	EE	Peter Glösekötter, Ulrich Greveler, Gilson I. Wirth: Device degradation and resilient computing. ISCAS 2008: 828-831
11	EE	Egas Henes Neto, Gilson I. Wirth, Fernanda Lima Kastensmidt: Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors. J. Electronic Testing 24(5): 425-437 (2008)
2007
10	EE	Lucas Brusamarello, Roberto da Silva, Ricardo A. L. Reis, Gilson I. Wirth: Yield Analysis by Error Propagation Using Numerical Derivatives Considering WD and D2D variations. ISVLSI 2007: 86-91
9	EE	Egas Henes Neto, Fernanda Lima Kastensmidt, Gilson I. Wirth: A built-in current sensor for high speed soft errors detection robust to process and temperature variations. SBCCI 2007: 190-195
8	EE	Dalton M. Colombo, Gilson I. Wirth, Sergio Bampi: Trim range limited by noise in bandgap voltage references. SBCCI 2007: 42-47
7	EE	Gustavo Neuberger, Fernanda Gusmão de Lima Kastensmidt, Ricardo Reis, Gilson I. Wirth, Ralf Brederlow, Christian Pacha: Statistical analysis of systematic and random variability of flip-flop race immunity in 130nm and 90nm CMOS technologies. VLSI-SoC 2007: 78-83
6	EE	Lucas Brusamarello, Roberto da Silva, Gilson I. Wirth, Ricardo A. L. Reis: Obtaining delay distribution of dynamic logic circuits by error propagation at the electrical level. VLSI-SoC 2007: 94-98
2006
5		Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt: Generation and Propagation of Single Event Transients in CMOS Circuits. DDECS 2006: 198-203
4	EE	Gilson I. Wirth, Ivandro Ribeiro, Michele G. Vieira, Fernanda Gusmão de Lima Kastensmidt: Single event transients in dynamic logic. SBCCI 2006: 184-189
3	EE	Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt: Using Bulk Built-in Current Sensors to Detect Soft Errors. IEEE Micro 26(5): 10-18 (2006)
2005
2	EE	Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt: Single event transients in combinatorial circuits. SBCCI 2005: 121-126
1	EE	Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt: Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic. SBCCI 2005: 62-67

Coauthor Index

1	Sergio Bampi	[8]
2	Ralf Brederlow	[7]
3	Lucas Brusamarello	[6] [10]
4	Dalton M. Colombo	[8]
5	Christian Jesús B. Fayomi	[13]
6	Peter Glösekötter	[12]
7	Ulrich Greveler	[12]
8	Fernanda Gusmão de Lima Kastensmidt (Fernanda Gusmão de Lima, Fernanda Lima Kastensmidt)	[1] [2] [3] [4] [5] [7] [9] [11]
9	Akira Matsuzawa	[13]
10	Egas Henes Neto	[1] [2] [3] [5] [9] [11]
11	Gustavo Neuberger	[7]
12	Christian Pacha	[7]
13	Jaime Ramírez-Angulo	[13]
14	Ricardo Augusto da Luz Reis (Ricardo A. L. Reis, Ricardo Reis)	[6] [7] [10]
15	Ivandro Ribeiro	[1] [3] [4]
16	Roberto da Silva	[6] [10]
17	Michele G. Vieira	[1] [2] [3] [4] [5]

Colors in the list of coauthors