| 2008 |
|---|
| 6 | EE | Egas Henes Neto,
Gilson I. Wirth,
Fernanda Lima Kastensmidt:
Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors.
J. Electronic Testing 24(5): 425-437 (2008) |
| 2007 |
|---|
| 5 | EE | Egas Henes Neto,
Fernanda Lima Kastensmidt,
Gilson I. Wirth:
A built-in current sensor for high speed soft errors detection robust to process and temperature variations.
SBCCI 2007: 190-195 |
| 2006 |
|---|
| 4 | | Gilson I. Wirth,
Michele G. Vieira,
Egas Henes Neto,
Fernanda Gusmão de Lima Kastensmidt:
Generation and Propagation of Single Event Transients in CMOS Circuits.
DDECS 2006: 198-203 |
| 3 | EE | Egas Henes Neto,
Ivandro Ribeiro,
Michele G. Vieira,
Gilson I. Wirth,
Fernanda Lima Kastensmidt:
Using Bulk Built-in Current Sensors to Detect Soft Errors.
IEEE Micro 26(5): 10-18 (2006) |
| 2005 |
|---|
| 2 | EE | Gilson I. Wirth,
Michele G. Vieira,
Egas Henes Neto,
Fernanda Gusmão de Lima Kastensmidt:
Single event transients in combinatorial circuits.
SBCCI 2005: 121-126 |
| 1 | EE | Egas Henes Neto,
Ivandro Ribeiro,
Michele G. Vieira,
Gilson I. Wirth,
Fernanda Lima Kastensmidt:
Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic.
SBCCI 2005: 62-67 |
