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Egas Henes Neto

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2008
6EEEgas Henes Neto, Gilson I. Wirth, Fernanda Lima Kastensmidt: Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors. J. Electronic Testing 24(5): 425-437 (2008)
2007
5EEEgas Henes Neto, Fernanda Lima Kastensmidt, Gilson I. Wirth: A built-in current sensor for high speed soft errors detection robust to process and temperature variations. SBCCI 2007: 190-195
2006
4 Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt: Generation and Propagation of Single Event Transients in CMOS Circuits. DDECS 2006: 198-203
3EEEgas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt: Using Bulk Built-in Current Sensors to Detect Soft Errors. IEEE Micro 26(5): 10-18 (2006)
2005
2EEGilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt: Single event transients in combinatorial circuits. SBCCI 2005: 121-126
1EEEgas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt: Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic. SBCCI 2005: 62-67

Coauthor Index

1Fernanda Gusmão de Lima Kastensmidt (Fernanda Gusmão de Lima, Fernanda Lima Kastensmidt) [1] [2] [3] [4] [5] [6]
2Ivandro Ribeiro [1] [3]
3Michele G. Vieira [1] [2] [3] [4]
4Gilson I. Wirth [1] [2] [3] [4] [5] [6]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)