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Keneth R. Wilsher

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2003
5EEKeneth R. Wilsher: Designed -in-diagnostics: A new optical method. ITC 2003: 246-253
4EEP. LeCoupanec, William K. Lo, Keneth R. Wilsher: An ultra-low dark-count and jitter, superconducting, single-photon detector for emission timing analysis of integrated circuits. Microelectronics Reliability 43(9-11): 1621-1626 (2003)
2001
3 G. Dajee, N. Goldblatt, T. Lundquist, S. Kasapi, Keneth R. Wilsher: Practical, non-invasive optical probing for flip-chip devices. ITC 2001: 433-442
2000
2 Travis M. Eiles, Keneth R. Wilsher, William K. Lo, G. Xiao: Optical interferometric probing of advanced microprocessors. ITC 2000: 80-84
1999
1 Keneth R. Wilsher, William K. Lo: Practical optical waveform probing of flip-chip CMOS devices. ITC 1999: 932-939

Coauthor Index

1G. Dajee [3]
2Travis M. Eiles [2]
3N. Goldblatt [3]
4S. Kasapi [3]
5P. LeCoupanec [4]
6William K. Lo [1] [2] [4]
7T. Lundquist [3]
8G. Xiao [2]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)