| 2003 |
|---|
| 5 | EE | Keneth R. Wilsher:
Designed -in-diagnostics: A new optical method.
ITC 2003: 246-253 |
| 4 | EE | P. LeCoupanec,
William K. Lo,
Keneth R. Wilsher:
An ultra-low dark-count and jitter, superconducting, single-photon detector for emission timing analysis of integrated circuits.
Microelectronics Reliability 43(9-11): 1621-1626 (2003) |
| 2001 |
|---|
| 3 | | G. Dajee,
N. Goldblatt,
T. Lundquist,
S. Kasapi,
Keneth R. Wilsher:
Practical, non-invasive optical probing for flip-chip devices.
ITC 2001: 433-442 |
| 2000 |
|---|
| 2 | | Travis M. Eiles,
Keneth R. Wilsher,
William K. Lo,
G. Xiao:
Optical interferometric probing of advanced microprocessors.
ITC 2000: 80-84 |
| 1999 |
|---|
| 1 | | Keneth R. Wilsher,
William K. Lo:
Practical optical waveform probing of flip-chip CMOS devices.
ITC 1999: 932-939 |
