T. Lundquist

2001
2		G. Dajee, N. Goldblatt, T. Lundquist, S. Kasapi, Keneth R. Wilsher: Practical, non-invasive optical probing for flip-chip devices. ITC 2001: 433-442
1		T. Lundquist, E. Delenia, J. Harroun, E. LeRoy, C.-C. Tsao: Ultra-Thinning of C4 Integrated Circuits for Backside Analysis during First Silicon Debug. Microelectronics Reliability 41(9-10): 1545-1549 (2001)

Coauthor Index

1	G. Dajee	[2]
2	E. Delenia	[1]
3	N. Goldblatt	[2]
4	J. Harroun	[1]
5	S. Kasapi	[2]
6	E. LeRoy	[1]
7	C.-C. Tsao	[1]
8	Keneth R. Wilsher	[2]

Colors in the list of coauthors