D. C. L. van Geest
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2001
1
F. G. M. de Jong
,
Alex S. Biewenga
, D. C. L. van Geest,
T. F. Waayers
: Testing and programming flash memories on assemblies during high volume production.
ITC 2001
: 470-479
Coauthor
Index
1
Alex S. Biewenga
[
1
]
2
F. G. M. de Jong
[
1
]
3
T. F. Waayers
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
