| 2006 |
|---|
| 3 | EE | Masayasu Ishiko,
Masanori Usui,
Takashi Ohuchi,
Mikio Shirai:
Design concept for wire-bonding reliability improvement by optimizing position in power devices.
Microelectronics Journal 37(3): 262-268 (2006) |
| 2005 |
|---|
| 2 | EE | Masanori Usui,
Masayasu Ishiko,
Koji Hotta,
Satoshi Kuwano,
Masato Hashimoto:
Effects of uni-axial mechanical stress on IGBT characteristics.
Microelectronics Reliability 45(9-11): 1682-1687 (2005) |
| 2002 |
|---|
| 1 | EE | Masanori Usui,
Takahide Sugiyama,
Masayasu Ishiko,
Jun Morimoto,
Hirokazu Saitoh,
Masaki Ajioka:
Characterization of Trench MOS Gate Structures Utilizing Photon Emission Microscopy.
Microelectronics Reliability 42(9-11): 1647-1652 (2002) |
