| |
| 2005 | ||
|---|---|---|
| 1 | EE | Masanori Usui, Masayasu Ishiko, Koji Hotta, Satoshi Kuwano, Masato Hashimoto: Effects of uni-axial mechanical stress on IGBT characteristics. Microelectronics Reliability 45(9-11): 1682-1687 (2005) |
| 1 | Koji Hotta | [1] |
| 2 | Masayasu Ishiko | [1] |
| 3 | Satoshi Kuwano | [1] |
| 4 | Masanori Usui | [1] |