| |
| 2002 | ||
|---|---|---|
| 1 | EE | Masanori Usui, Takahide Sugiyama, Masayasu Ishiko, Jun Morimoto, Hirokazu Saitoh, Masaki Ajioka: Characterization of Trench MOS Gate Structures Utilizing Photon Emission Microscopy. Microelectronics Reliability 42(9-11): 1647-1652 (2002) |
| 1 | Masayasu Ishiko | [1] |
| 2 | Jun Morimoto | [1] |
| 3 | Hirokazu Saitoh | [1] |
| 4 | Takahide Sugiyama | [1] |
| 5 | Masanori Usui | [1] |