Kazuyoshi Torii

2005
2	EE	Takeo Matsuki, Kazuyoshi Torii, Takeshi Maeda, Yasushi Akasaka, Kiyoshi Hayashi, Naoki Kasai, Tsunetoshi Arikado: Gate-Last MISFET Structures and Process for Characterization of High-k and Metal Gate MISFETs. IEICE Transactions 88-C(5): 804-810 (2005)
2002
1	EE	Eiji Takeda, Eiichi Murakami, Kazuyoshi Torii, Yutaka Okuyama, Eishi Ebe, Kenji Hinode, Shin'ichiro Kimura: Reliability issues of silicon LSIs facing 100-nm technology node. Microelectronics Reliability 42(4-5): 493-506 (2002)

Coauthor Index

1	Yasushi Akasaka	[2]
2	Tsunetoshi Arikado	[2]
3	Eishi Ebe	[1]
4	Kiyoshi Hayashi	[2]
5	Kenji Hinode	[1]
6	Naoki Kasai	[2]
7	Shin'ichiro Kimura	[1]
8	Takeshi Maeda	[2]
9	Takeo Matsuki	[2]
10	Eiichi Murakami	[1]
11	Yutaka Okuyama	[1]
12	Eiji Takeda	[1]

Colors in the list of coauthors