| |
| 2002 | ||
|---|---|---|
| 1 | EE | Eiji Takeda, Eiichi Murakami, Kazuyoshi Torii, Yutaka Okuyama, Eishi Ebe, Kenji Hinode, Shin'ichiro Kimura: Reliability issues of silicon LSIs facing 100-nm technology node. Microelectronics Reliability 42(4-5): 493-506 (2002) |
| 1 | Eishi Ebe | [1] |
| 2 | Kenji Hinode | [1] |
| 3 | Eiichi Murakami | [1] |
| 4 | Yutaka Okuyama | [1] |
| 5 | Eiji Takeda | [1] |
| 6 | Kazuyoshi Torii | [1] |