| 2007 |
|---|
| 4 | EE | Tadahiko Sugibayashi,
Takeshi Honda,
Noboru Sakimura,
Shuichi Tahara,
Naoki Kasai:
MRAM Applications Using Unlimited Write Endurance.
IEICE Transactions 90-C(10): 1936-1940 (2007) |
| 3 | EE | Takeshi Honda,
Noboru Sakimura,
Tadahiko Sugibayashi,
Naoki Kasai,
Hiromitsu Hada,
Shuichi Tahara:
Writing Circuitry for Toggle MRAM to Screen Intermittent Failure Mode.
IEICE Transactions 90-C(2): 531-535 (2007) |
| 2005 |
|---|
| 2 | EE | Naoki Kasai:
Special Section on Microelectronic Test Structures.
IEICE Transactions 88-C(5): 781 (2005) |
| 1 | EE | Takeo Matsuki,
Kazuyoshi Torii,
Takeshi Maeda,
Yasushi Akasaka,
Kiyoshi Hayashi,
Naoki Kasai,
Tsunetoshi Arikado:
Gate-Last MISFET Structures and Process for Characterization of High-k and Metal Gate MISFETs.
IEICE Transactions 88-C(5): 804-810 (2005) |
