| |
| 2008 | ||
|---|---|---|
| 2 | EE | Mutsuo Hidaka, Shuichi Nagasawa, Kenji Hinode, Tetsuro Satoh: Improvements in Fabrication Process for Nb-Based Single Flux Quantum Circuits in Japan. IEICE Transactions 91-C(3): 318-324 (2008) |
| 2002 | ||
| 1 | EE | Eiji Takeda, Eiichi Murakami, Kazuyoshi Torii, Yutaka Okuyama, Eishi Ebe, Kenji Hinode, Shin'ichiro Kimura: Reliability issues of silicon LSIs facing 100-nm technology node. Microelectronics Reliability 42(4-5): 493-506 (2002) |
| 1 | Eishi Ebe | [1] |
| 2 | Mutsuo Hidaka | [2] |
| 3 | Shin'ichiro Kimura | [1] |
| 4 | Eiichi Murakami | [1] |
| 5 | Shuichi Nagasawa | [2] |
| 6 | Yutaka Okuyama | [1] |
| 7 | Tetsuro Satoh | [2] |
| 8 | Eiji Takeda | [1] |
| 9 | Kazuyoshi Torii | [1] |