| |
| 2005 | ||
|---|---|---|
| 1 | EE | Takeo Matsuki, Kazuyoshi Torii, Takeshi Maeda, Yasushi Akasaka, Kiyoshi Hayashi, Naoki Kasai, Tsunetoshi Arikado: Gate-Last MISFET Structures and Process for Characterization of High-k and Metal Gate MISFETs. IEICE Transactions 88-C(5): 804-810 (2005) |
| 1 | Yasushi Akasaka | [1] |
| 2 | Tsunetoshi Arikado | [1] |
| 3 | Kiyoshi Hayashi | [1] |
| 4 | Naoki Kasai | [1] |
| 5 | Takeshi Maeda | [1] |
| 6 | Kazuyoshi Torii | [1] |