C. Tolant

2006
2	EE	H. Maanane, M. Masmoudi, J. Marcon, M. A. Belaïd, K. Mourgues, C. Tolant, K. Ketata, Ph. Eudeline: Study of RF N- LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RF. Microelectronics Reliability 46(5-6): 994-1000 (2006)
1	EE	M. Gares, H. Maanane, M. Masmoudi, P. Bertram, J. Marcon, M. A. Belaïd, K. Mourgues, C. Tolant, Ph. Eudeline: Hot carrier reliability of RF N- LDMOS for S Band radar application. Microelectronics Reliability 46(9-11): 1806-1811 (2006)

Coauthor Index

1	M. A. Belaïd	[1] [2]
2	P. Bertram	[1]
3	Ph. Eudeline	[1] [2]
4	M. Gares	[1]
5	K. Ketata	[2]
6	H. Maanane	[1] [2]
7	J. Marcon	[1] [2]
8	M. Masmoudi	[1] [2]
9	K. Mourgues	[1] [2]