P. Bertram

2006
2	EE	M. Gares, H. Maanane, M. A. Belaïd, M. Masmoudi, J. Marcon, K. Mourgues, P. Bertram, Ph. Eudeline: Impact de la Temperature sur la Fiabilite des Composants rf Ldmos de Puissance. CCECE 2006: 382-385
1	EE	M. Gares, H. Maanane, M. Masmoudi, P. Bertram, J. Marcon, M. A. Belaïd, K. Mourgues, C. Tolant, Ph. Eudeline: Hot carrier reliability of RF N- LDMOS for S Band radar application. Microelectronics Reliability 46(9-11): 1806-1811 (2006)

Coauthor Index

1	M. A. Belaïd	[1] [2]
2	Ph. Eudeline	[1] [2]
3	M. Gares	[1] [2]
4	H. Maanane	[1] [2]
5	J. Marcon	[1] [2]
6	M. Masmoudi	[1] [2]
7	K. Mourgues	[1] [2]
8	C. Tolant	[1]