| 2006 |
|---|
| 3 | EE | M. Gares,
H. Maanane,
M. A. Belaïd,
M. Masmoudi,
J. Marcon,
K. Mourgues,
P. Bertram,
Ph. Eudeline:
Impact de la Temperature sur la Fiabilite des Composants rf Ldmos de Puissance.
CCECE 2006: 382-385 |
| 2 | EE | H. Maanane,
M. Masmoudi,
J. Marcon,
M. A. Belaïd,
K. Mourgues,
C. Tolant,
K. Ketata,
Ph. Eudeline:
Study of RF N- LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RF.
Microelectronics Reliability 46(5-6): 994-1000 (2006) |
| 1 | EE | M. Gares,
H. Maanane,
M. Masmoudi,
P. Bertram,
J. Marcon,
M. A. Belaïd,
K. Mourgues,
C. Tolant,
Ph. Eudeline:
Hot carrier reliability of RF N- LDMOS for S Band radar application.
Microelectronics Reliability 46(9-11): 1806-1811 (2006) |
