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| 2008 | ||
|---|---|---|
| 2 | EE | Jin Guo, Antonis Papanikolaou, Michele Stucchi, Kristof Croes, Zsolt Tokei, Francky Catthoor: A tool flow for predicting system level timing failures due to interconnect reliability degradation. ACM Great Lakes Symposium on VLSI 2008: 291-296 |
| 2006 | ||
| 1 | EE | Antonis Papanikolaou, Miguel Miranda, Hua Wang, Francky Catthoor, M. Satyakiran, Pol Marchal, Ben Kaczer, C. Bruynseraede, Zsolt Tokei: Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design. VLSI-SoC 2006: 342-347 |
| 1 | C. Bruynseraede | [1] |
| 2 | Francky Catthoor | [1] [2] |
| 3 | Kristof Croes | [2] |
| 4 | Jin Guo | [2] |
| 5 | Ben Kaczer | [1] |
| 6 | Pol Marchal | [1] |
| 7 | Miguel Miranda | [1] |
| 8 | Antonis Papanikolaou | [1] [2] |
| 9 | M. Satyakiran | [1] |
| 10 | Michele Stucchi | [2] |
| 11 | Hua Wang | [1] |