| |
| 2006 | ||
|---|---|---|
| 1 | EE | Antonis Papanikolaou, Miguel Miranda, Hua Wang, Francky Catthoor, M. Satyakiran, Pol Marchal, Ben Kaczer, C. Bruynseraede, Zsolt Tokei: Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design. VLSI-SoC 2006: 342-347 |
| 1 | C. Bruynseraede | [1] |
| 2 | Francky Catthoor | [1] |
| 3 | Ben Kaczer | [1] |
| 4 | Pol Marchal | [1] |
| 5 | Miguel Miranda | [1] |
| 6 | Antonis Papanikolaou | [1] |
| 7 | Zsolt Tokei | [1] |
| 8 | Hua Wang | [1] |