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2002 | ||
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2 | EE | L. Tielemans, R. Rongen, Ward De Ceuninck: How reliable are reliability tests? Microelectronics Reliability 42(9-11): 1339-1345 (2002) |
2001 | ||
1 | K. Croes, R. Dreesen, J. Manca, Ward De Ceuninck, Luc De Schepper, L. Tielemans, P. van Der Wel: High-resolution in-situ of gold electromigration: test time reduction. Microelectronics Reliability 41(9-10): 1439-1442 (2001) |
1 | Ward De Ceuninck | [1] [2] |
2 | K. Croes | [1] |
3 | R. Dreesen | [1] |
4 | J. Manca | [1] |
5 | R. Rongen | [2] |
6 | Luc De Schepper | [1] |
7 | P. van Der Wel | [1] |