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L. Tielemans

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2002
2EEL. Tielemans, R. Rongen, Ward De Ceuninck: How reliable are reliability tests? Microelectronics Reliability 42(9-11): 1339-1345 (2002)
2001
1 K. Croes, R. Dreesen, J. Manca, Ward De Ceuninck, Luc De Schepper, L. Tielemans, P. van Der Wel: High-resolution in-situ of gold electromigration: test time reduction. Microelectronics Reliability 41(9-10): 1439-1442 (2001)

Coauthor Index

1Ward De Ceuninck [1] [2]
2K. Croes [1]
3R. Dreesen [1]
4J. Manca [1]
5R. Rongen [2]
6Luc De Schepper [1]
7P. van Der Wel [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)