R. Rongen
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2002
1
EE
L. Tielemans
, R. Rongen,
Ward De Ceuninck
: How reliable are reliability tests?
Microelectronics Reliability 42
(9-11): 1339-1345 (2002)
Coauthor
Index
1
Ward De Ceuninck
[
1
]
2
L. Tielemans
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
