| |
| 2001 | ||
|---|---|---|
| 1 | K. Croes, R. Dreesen, J. Manca, Ward De Ceuninck, Luc De Schepper, L. Tielemans, P. van Der Wel: High-resolution in-situ of gold electromigration: test time reduction. Microelectronics Reliability 41(9-10): 1439-1442 (2001) | |
| 1 | Ward De Ceuninck | [1] |
| 2 | K. Croes | [1] |
| 3 | R. Dreesen | [1] |
| 4 | J. Manca | [1] |
| 5 | Luc De Schepper | [1] |
| 6 | L. Tielemans | [1] |