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Heiko Thust

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2006
2EEAndrzej Dziedzic, Andrzej Kolek, Waleed Ehrhardt, Heiko Thust: Advanced electrical and stability characterization of untrimmed and variously trimmed thick-film and LTCC resistors. Microelectronics Reliability 46(2-4): 352-359 (2006)
2001
1EEAndrzej Dziedzic, Leszek J. Golonka, Jaroslaw Kita, Heiko Thust, Karl-Heinz Drue, Reinhard Bauer, Lars Rebenklau, Klaus-Jürgen Wolter: Electrical and stability properties and ultrasonic microscope characterisation of low temperature co-fired ceramics resistors. Microelectronics Reliability 41(5): 669-676 (2001)

Coauthor Index

1Reinhard Bauer [1]
2Karl-Heinz Drue [1]
3Andrzej Dziedzic [1] [2]
4Waleed Ehrhardt [2]
5Leszek J. Golonka [1]
6Jaroslaw Kita [1]
7Andrzej Kolek [2]
8Lars Rebenklau [1]
9Klaus-Jürgen Wolter [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)