2006 | ||
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2 | EE | Andrzej Dziedzic, Andrzej Kolek, Waleed Ehrhardt, Heiko Thust: Advanced electrical and stability characterization of untrimmed and variously trimmed thick-film and LTCC resistors. Microelectronics Reliability 46(2-4): 352-359 (2006) |
2001 | ||
1 | EE | Andrzej Dziedzic, Leszek J. Golonka, Jaroslaw Kita, Heiko Thust, Karl-Heinz Drue, Reinhard Bauer, Lars Rebenklau, Klaus-Jürgen Wolter: Electrical and stability properties and ultrasonic microscope characterisation of low temperature co-fired ceramics resistors. Microelectronics Reliability 41(5): 669-676 (2001) |
1 | Reinhard Bauer | [1] |
2 | Karl-Heinz Drue | [1] |
3 | Andrzej Dziedzic | [1] [2] |
4 | Waleed Ehrhardt | [2] |
5 | Leszek J. Golonka | [1] |
6 | Jaroslaw Kita | [1] |
7 | Andrzej Kolek | [2] |
8 | Lars Rebenklau | [1] |
9 | Klaus-Jürgen Wolter | [1] |