| |
| 2006 | ||
|---|---|---|
| 1 | EE | Andrzej Dziedzic, Andrzej Kolek, Waleed Ehrhardt, Heiko Thust: Advanced electrical and stability characterization of untrimmed and variously trimmed thick-film and LTCC resistors. Microelectronics Reliability 46(2-4): 352-359 (2006) |
| 1 | Andrzej Dziedzic | [1] |
| 2 | Andrzej Kolek | [1] |
| 3 | Heiko Thust | [1] |