A. F. Tasch Jr.

List of publications from the DBLP Bibliography Server - FAQ

1993

3 EE C. Patrick Yue, Victor Martin Agostinelli Jr., Gregory Munson Yeric, A. F. Tasch Jr.: Improved universal MOSFET electron mobility degradation models for circuit simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 12(10): 1542-1546 (1993)

2 EE Victor Martin Agostinelli Jr., Greg M. Yeric, A. F. Tasch Jr.: Universal MOSFET hole mobility degradation models for circuit simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 12(3): 439-445 (1993)

1990

1 EE Gregory Munson Yeric, A. F. Tasch Jr., Sanjay K. Banerjee: A universal MOSFET mobility degradation model for circuit simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 9(10): 1123-1126 (1990)

1993
3	EE	C. Patrick Yue, Victor Martin Agostinelli Jr., Gregory Munson Yeric, A. F. Tasch Jr.: Improved universal MOSFET electron mobility degradation models for circuit simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 12(10): 1542-1546 (1993)
2	EE	Victor Martin Agostinelli Jr., Greg M. Yeric, A. F. Tasch Jr.: Universal MOSFET hole mobility degradation models for circuit simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 12(3): 439-445 (1993)
1990
1	EE	Gregory Munson Yeric, A. F. Tasch Jr., Sanjay K. Banerjee: A universal MOSFET mobility degradation model for circuit simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 9(10): 1123-1126 (1990)

Coauthor Index

1	Victor Martin Agostinelli Jr.	[2] [3]
2	Sanjay K. Banerjee	[1]
3	Greg M. Yeric	[2]
4	Gregory Munson Yeric	[1] [3]
5	C. Patrick Yue	[3]